Single Event Effects (SEE) are prevalent in space, for aerospace applications and even at ground level because transistor dimensions have been scaled sufficiently that most digital devices are sensitive to SEE. The cost of testing at accelerators is high and availability is poor. Hence, the confluence of these factors now makes laser SEE testing attractive.

SEREEL2 provides a complete solution to the testing and sensitivity analysis of semiconductor devices by the use of a pulsed laser to simulate the impact of a heavy ion. Offering the possibility to investigate the response at both the front and back surfaces of a die, SEREEL2 provides direct correlation of the upset site with a location on the die and automated scanning of user-defined areas of the sample. The system is highly customisable to suit your particular requirements, as detailed in the datasheets available on this page.

The SEESIM operating system and user interface provides a seamless and intuitive control panel for setting up SEREEL2, defining scan patterns and conditions and analysing results. Multiple scans with different areas, pulse energies and scan rates can be defined and left to run in unattended mode. Our API allows your data acquisition instruments to capture the response of the test sample and send the results to SEESIM. These are then displayed on a heatmap that is clickable to show the captured data at each spot site. Overlaid onto a montage of the whole die, it is then easy to identify the sensitive features on the sample.

Available Data Sheets for Download

Key Features

  • Single-photon (SPA) and two-photon (TPA) versions available
  • Highly stable, rugged and industrial lasers requiring no routine tuning
  • Pulse widths from <200fs to 500ps
  • Wavelengths suitable for Si, GaAs and WBG materials
  • X, Y and Z movement stages to 0.05 micron repeatability over a range of up to 300mm
  • Step-free scanning by use of a piezo stage
  • IR camera for back surface imaging
  • Visible camera for die position location
  • Self-levelling of the die and auto-focus features
  • Objective lenses with x5, x20, x50 and x100 magnification available
  • Custom software based upon MATLAB with user-friendly GUI

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