Single-event effects (SEE) testing is becoming relevant not only for its traditional domain of space but also for avionics and even ground-based systems. SEEs are caused by a heavy ion or proton passing through semiconductor material and depositing sufficient energy to disrupt operation of the device. These events can be either destructive or non-destructive and increase the risk of a mission failure. Using sources of heavy ions, protons or neutrons, Radtest can carry out SEE testing with the appropriate type of radiation for your environment.

Measuring event rates for SEU (single event upset, MBU & MCU), SET (single event transient), SEL (single event latch-up) and SEFI (single event functional interrupt) for analogue and digital ICs, as well as SEB/SEGR (single event burnout and single event gate rupture) for MOSFETs, helps you quantify risk for your mission.

Radtest can prepare test plans, make bias and test boards and perform electrical measurements before, during and after SEE testing to provide you with the data you need. A full test report and data package are included for all tests. Complete our enquiry form for more details on how we can help you with SEE testing.